TFCompanion - Optical Metrology Software
TFCompanion is a powerful and user friendly software application for thin film analysis and metrology.It combines versatile analytical tools for interpretation of measurement data - to determine actual physical parameters of a filmstack (like thicknesses of the layers and optical properties of the materials). It allows simulation and sensitivity analysis to understand better why the things are the way they are. TFCompanion gives the ability to estimate measurement/calculation errors, create and optimize measurement recipes and mitigate tradeoffs between measurement accuracy and thruput. more about it...
TFCompanion is all you come to expect from R&D and production tools in one ... plus some more.
All measurement tools include software to interpret measurement results, some of these software packages can be used on a desktop. However, software integrated with the instruments has limited capabilities specific to that instrument. If you have several instruments e.g. spectral reflectometer and ellipsometer each has its own software. One need to learn several software packages and cannot easily share or combine data, recipes, etc. Ask yourself, would you purchase that software as a separate product without the hardware - probably not (and, in most cases, it is not sold separately, anyway).
There are independent software packages that allow to simulate and interpret some measurement results. However, they are either limited to specific application or have no support and have not been updated for years.
So, what is different about TFCompanion?
- TFCompanion is the only software software you will ever need for all thin-film optical measurement data analysis. It supports ellipsometry, reflectance transmittance (including imaging analysis). Variety of other techniques are also supported, e.g. Total Internal Reflection Ellipsometry (TIRE), Surface Plasmon Resonance (SPR), Brewster Angle Microscopy (BAM), etc. TFCompanion is the only independent software specifically build for optical metrology to support wide range of techniques and applications.
- TFCompanion has all the standard features supported by optical metrology software plus some unique features you will not find anywhere;
- TFCompanion enables you to create optimized measurement recipe and select the best tool for the measurement;
- TFCompanion can be easily integrated with many metrology instruments of your choice.
TFCompanion is a fusion of optical metrology, material science, process development experience with the latest computer technology.
TFCompanion is designed and developed from ground-up using pure Java technology. This mean it is OS independent and can be used on any Operating System that has Java Virtual Machine (JVM). TFCompanion can be used as a standalone client application or as an OEM for other products. It is also using specially tuned and optimized calculation algorithm - so you are getting results fast. more about it...