TFCompanion Tutorial

Nanofilm Imaging Ellipsometer Users

This is a three part Tutorial - each part can be viewed separately

Tutorial Part I. Basic introduction. Import of the measured data. Example of etched oxide sample calculation using only Delta map.

Tutorial_Part II. An example of Organosilane dots on SiO2. Analysis and correction of measurment conditions: simulation and sensitivity analysis. Effect of convergent light beam.

Tutorial_Part III. Example of Part II using different filmstack (creating new material and filmstack). Operations with ROIs: Linescan calculation, combined ROI. Software configuration.