> > > > > ## TFCompanion Tutorial

## Nanofilm Imaging Ellipsometer Users

### This is a three part Tutorial - each part can be viewed separately

### Tutorial Part I. Basic introduction. Import of the measured data. Example of etched oxide sample calculation using only Delta map.

### Tutorial_Part II. An example of Organosilane dots on SiO2. Analysis and correction of measurment conditions: simulation and sensitivity analysis. Effect of convergent light beam.

### Tutorial_Part III. Example of Part II using different filmstack (creating new material and filmstack). Operations with ROIs: Linescan calculation, combined ROI. Software configuration.

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