Semiconsoft - Home page

Semiconductor, Biotechnology, Magnetic media, Chemistry, Optical coatings, Polymers; Production and R&D

Several version and capabilties levels are supported: versions from Basic to Advanced; capabilities from Reflectance/Transmittance only and Ellipsometry only, to a combination of both & Imaging Ellipsometry/Reflectometry/Microscopy
R&D and production environment support: from Adminstrator to Operator level interface and functionality.
Extensive material library and support of a wide range of parametrized materials types from Cauchy to Cody-Lorentz

Data Analysis Software.

TFCompanion software is a de facto standard for thin-film data analysis for ellipsometry, reflectance and transmittance measurements. Researchers and engineers from around the world relying of our software for analysis of semiconductor, biotechnology, chemical, LCD, magnetic media and many other applications in universities, R&D and production environment. Metrology vendors use it to identify precision improvement, semiconductor fabs use it to qualify metrology equipment, optical coating engineers use it to quickly identify the problems, in-situ and ex-situ measurements for various applications are enabled by TFCompanion software. From most simple, routine measurements to multilayer, multisample analysis - our software is ready to help ( more...)

Software integration.

TFCompanion has integrated control and data acquisition module and a TCP server. Full network integration and remote command interface are supported. On line (production) or in-situ (vacuum deposition chamber integration) measurements are supported using several scenarios:

a) measured data and instructions command aresend over over network to TFCompanion for analysis and results are send back to a specified location

b).TFCompanion is integrated with a Semiconsoft M-series measurement system; a measure command is send over network - the measurement is performed, analyzed and results are send to a specified location

c).TFCompanion is integrated over network with a third party measurement system and controls measurement and analysis process as well as synchronization with other systems e.g. position sensors, motors, etc. Results are send to a specified location.

Measurement hardware.

We offer a wide range of modular thin-film measurement instruments: ellipsometers, imaging ellipsometers & reflectometers for all budgets and applications. We work closely with hardware manufacturers to select the most advanced, reliable and cost effective solutions. PicoProbe series of spectroscopic and single wavelength ellipsometers offers unparalleled precision and measurement speed. PicoScan system is a first truly quantitative Imaging ellipsometer, M-series fiber optics reflectomers are small, precise and affordable solutions, TR-series custom reflectometers made to most exacting specifications for the widest possible wavelength range (more...)