Products


 

MProbe: Thin-film measurement systems
Product DescriptionDetails
MProbe 20 Desktop system for thin-film measurement of R&D and manufacturing applications. Several models with different wavelength and thickness ranges are available. This system can be used with the Mapping stage option View More
MProbe 40 Microscope based system for thin-film measurement.Supports small spot measurement and visualization of the measurement area. Several models with different wavelength and thickness ranges are available. Used for R&D and manufacturing applications View More
MProbe HC Thin-film system for measurement of hard coatings. Supports measurement on thin substrates and curved surfaces. Used for R&D and manufacturing applications View More
MProbe in-situ Desktop system for thin-film measurement of R&D and manufacturing applications. This system can be used with the Mapping stage option View More
Motorized XY mapping stage Mapping stage accessory for Mprobe 20 and MProbe 40 systems. Includes stepper motors driven XY stage and controller View More

MProbe: Plasma Monitor
Product DescriptionDetails
MProbe PMUVVis Broadband Plasma Monitor system wavelength range: 200 – 1000nm supports software integration with production systems (Modbus and OPC servers) View More

TFCompanion software
Product DescriptionDetails
TFCompanion Thin film data analysis and data acquisition software. It is included with the MProbe system and also can used standalone for analysis for reflectance/transmittance and ellipsometry data – including imaging ellipsometry/reflectometry View More