TFCompanion is a powerful and user friendly software application for thin film analysis and metrology.It combines versatile analytical tools for interpretation of measurement data – to determine actual physical parameters of a filmstack (like thicknesses of the layers and optical properties of the materials).
Analyze Reflectance, transmittance, ellipsometry spectra together or separately. Supports analysis of Imaging ellipsometry, reflectance, transmittance data.
Determine filmstack parameters based on measurement results: thickness, optical constants, surface roughness, bandgap…
Simulate reflectance/transmittance/ellipsometry spectra from a specified filmstack, determine measurement sensitivity to filmstack parameters
Estimate measurement repeatability based on selected filmstack and system configuration. Pre-flight optimization of measurement recipe for maximum precision.
Includes Large materials library(500+ materials), supports large number of parametrized material types from Cauchy to Tauc-Lorentz to Drude approximations to represent optical constants dispersion for a wide variety of materials and enable n&k measurement.
Imports measurement data in any text format, specifically supports import from all major ellipsometer/reflectomer instruments
Integrates with many commercial fiberoptics spectrometers for smooth data acquisition and data analysis
TFCompanion supports simulation and sensitivity analysis to understand better the effect of filmstack changes on measured data. It gives the ability to estimate measurement/calculation errors, create and optimize measurement recipes and mitigate tradeoffs between measurement accuracy and thruput. TFCompanion is integrated with our MProbe system and it is also used as a standalone software for data analysis. You can even build your own system using commercial spectrometers supported by TFCompanion and various available accessories. Unlike most of software packages that supplied with the instruments, TFCompanion can be used to import data from other instruments. There are several version of TFCompanion that include a range of capabilities – please check the brochure. If you have several instruments e.g. spectral reflectometer and ellipsometer – data from both instruments can be imported in TFCompanion and analyzed. There is no needs to learn several software packages and data can be easily shared or combined data.
So, what is different about TFCompanion?
TFCompanion is the only software software you will ever need for all thin-film optical measurement data analysis. It supports ellipsometry, reflectance transmittance (including imaging analysis). Variety of other techniques are also supported, e.g. Total Internal Reflection Ellipsometry (TIRE), Surface Plasmon Resonance (SPR), Brewster Angle Microscopy (BAM), etc. TFCompanion is the only independent software specifically build for optical metrology to support wide range of techniques and applications.
TFCompanion has all the standard features supported by optical metrology software plus some unique features you will not find anywhere.TFCompanion enables you to create optimized measurement recipe and select the best tool for the measurement;
TFCompanion has extensive automation options for integration the control systems and other third party software. OPC server, TCPIP Modbus server, proprietary TCP communication interface. Support for position sensors, stepper motors, TTL trigger synchronization…
TFCompanion is designed and developed from ground-up using pure Java technology. This mean it is OS independent and can be used on any Operating System that has Java Virtual Machine (JVM). TFCompanion can be used as a standalone client application or as an OEM library for other products. It is also using specially tuned and optimized calculation algorithm – so you are getting results fast.