MProbe 60 is a complete turnkey system designed for R&D centers and small manufacturing. It combines the ability to measure thickness/n&k with mapping automation and small spot measurement. MProbe 60 is used by leading R&D/Nanotechnology centers worldwide. The thicknesses from 1nm – 2mm, including multilayer filmstacks, can be measured quickly and reliably. Different MProbe 40 models are distringuished primarily by wavelength ranges and resolutions of spectrometers, which in turn determine the thickness range that can be measured.