Get a Quote


About us

Making thickness measurements easy

Semiconsoft, Inc was founded in 2001 with the mission to make data analysis of thickness measurement easy and transparent to users. TFCompanion software enabled engineers to import ellipsometry, reflectance, transmittance and imaging ellipsometry data and quickly analyze it combining data sets from different systems. It also helped determining which system configuration works best for specific application.

 In 2008, MProbe system was introduced – it combined  TFCompanion software with spectroscopic reflectometer hardware. The result was an affordable thin film measurement system with remarkable accuracy, precision and powerful user -friendly software.  MProbe measurement takes less than a second by operators that can be trained in minutes.  Everybody is a thin-film measurement expert with MProbe system.

All our systems are designed and manufractured in USA. They are build from the scratch to the highest standards and we take pride in their performance.

Convinced ? Well Let’s have a talk then.

Contact Us
Privacy Settings
We use cookies to enhance your experience while using our website. If you are using our Services via a browser you can restrict, block or remove cookies through your web browser settings. We also use content and scripts from third parties that may use tracking technologies. You can selectively provide your consent below to allow such third party embeds. For complete information about the cookies we use, data we collect and how we process them, please check our Privacy Policy
Consent to display content from Youtube
Consent to display content from Vimeo
Google Maps
Consent to display content from Google
Consent to display content from Spotify
Sound Cloud
Consent to display content from Sound
Get a Quote
Cart Overview