Semiconsoft, Inc was founded in 2001 with the mission to make data analysis of thickness measurement easy and transparent to users. TFCompanion software enabled engineers to import ellipsometry, reflectance, transmittance and imaging ellipsometry data and quickly analyze it combining data sets from different systems. It also helped determining which system configuration works best for specific application.
In 2008, MProbe system was introduced – it combined TFCompanion software with spectroscopic reflectometer hardware. The result was an affordable thin film measurement system with remarkable accuracy, precision and powerful user -friendly software. MProbe measurement takes less than a second by operators that can be trained in minutes. Everybody is a thin-film measurement expert with MProbe system.
All our systems are designed and manufractured in USA. They are build from the scratch to the highest standards and we take pride in their performance.