MProbe UVVisF allows measurement of thickness and refractive index. This system is similar to MProbe UVVisSr system but has a shorter wavelength range weighted towards the UV wavelengths. It is designed for applications requiring fast measurement and long lamp life. In-situ, inline and production QC are some of the areas where MProbeUVVisF is used. This system can work in high ambient light environement (e.g. sputtering) because it is using gated acquisition of Xe lamp flashes (~1 ms). Different intensity Xe lamps options are available and intensity is regulated by the software.
Thin film measurement system. Practically, any transluscent film can be measured quickly and reliably.
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