MProbe 20 is a thin film thickness measurement desktop system used for thousands of applications worldwide. It measures thin film thickness and refractive index with a single mouse-click. The thicknesses from 1nm – 1mm, including multilayer filmstacks, can be measured quickly and reliably. Different MProbe 20 models are distinguished primarily by wavelength ranges and resolution of spectrometers, which in turn determines the thickness range and types of the materials that can be measured. The measurement technology is based on spectroscopic reflectance – it is fast, reliable and non-destructive.