Get a Quote

MPROBE HC –  THICKNESS MEASUREMENT ON CURVED SURFACES

Measurement tutorial (Ytube)

Thin film thickness measurement on curved surfaces and large parts is easy with MProbe HC system. MProbeHC is based on MProbe 20 Vis platform with advanced data analysis algorithms specifically optimized for single and dual layer applications. It, also, uses manual probe instead of the sample stage. Manual probe is connected to measurement unit with a fiberoptics cable. This gives flexibility to measure thickness on curved and large surfaces in any location. Some application example include: anti-UV and hardcoat layers on headlights, bumpers, taillight covers, anti-fog coating on lenses and other surface in automotive manufacturing process and coating on eye glass lenses. Standard manual probe is used for measurement of  parts 20mm or larger. Custom probes can be done to measure coating thickness on area as small as 10mm.  For thickness measurement on smaller or round/cylindrical parts we recommend MProbe 40 MSP system

MProbe-HC brochure

WHY MPROBE HC?

  • Support primer or interface (IPL) layers
  • Thickness measurement on curved surfaces and/or large parts
  • Can measure colored products, corrects for backside reflection
  • Materials: 500+ extended material database
  • One click reliable measurement
  • Software: user friendly desktop interface and feature rich TFCompanion software can handle even most complex applications. 
  •  Affordable: unmatched price/performance
  • A complete system (PC is optional)

MPROBE HC:  measurement of a coating on car headlights covers

WHAT IS IN THE BOX

  • Main unit (includes spectrometer, light source) 
  • Fiberoptics reflectance probe
  • Manual probe
  • TFCompanion -RA software, USB dongle(license key), USB memory stick with softwar distribution,User Guide and other materials
  •  Calibration set (bare Si wafer and Quartz plate) 
  • USB cable and  24VDC power supply adapter (110/220V)

BASIC SPECIFICATION:
Wavelength range: 400-1000nm
Precision: <0.01nm or 0.01% (s.d.of 100 measurements on 200nm oxide)
Accuracy: <1nm or 0.2% (filmstack dependent)
 Measurement:< 100ms (typical, depends on sample reflectivity)
Spot size: <0.5mm
Sample size: >20mm
Custom probes can be designed on request

Privacy Settings
We use cookies to enhance your experience while using our website. If you are using our Services via a browser you can restrict, block or remove cookies through your web browser settings. We also use content and scripts from third parties that may use tracking technologies. You can selectively provide your consent below to allow such third party embeds. For complete information about the cookies we use, data we collect and how we process them, please check our Privacy Policy
Youtube
Consent to display content from Youtube
Vimeo
Consent to display content from Vimeo
Google Maps
Consent to display content from Google
Spotify
Consent to display content from Spotify
Sound Cloud
Consent to display content from Sound
Get a Quote
Cart Overview