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                                  TFCOMPANION SOFTWARE:                                                 REFLECTANCE, TRANSMITTANCE, ELLIPSOMETRY

TFCompanion software is included with all MProbe systems. It is also available as a standalone software for thin-film data analysis (various versions for reflectance, ellipsometry, imaging ellipsometry, etc.) Software plays a critical role in thin-film thickness measurement. It has two distinct functions that are transparent to the user: control/data acquisition of reflectance data( from the hardware) and data analysis/interpretation.

TFCompanion is a powerful and user friendly software application for thin film analysis and metrology.It combines versatile analytical tools for interpretation of measurement data – to determine actual physical parameters of a filmstack (like thicknesses of the layers and optical properties of the materials).

Analyze: Reflectance, transmittance, ellipsometry spectra together or separately. Supports analysis of Imaging ellipsometry, reflectance, transmittance data. Determine filmstack parameters based on measurement results: thickness, optical constants, surface roughness, bandgap…

Simulate: reflectance/transmittance/ellipsometry spectra from a specified filmstack, determine measurement sensitivity to filmstack parameters

Estimate: measurement repeatability based on selected filmstack and system configuration. Pre-flight optimization of measurement recipe for maximum precision. Includes Large materials library(500+ materials), supports large number of parametrized material types from Cauchy to Tauc-Lorentz to Drude approximations to represent optical constants dispersion for a wide variety of materials and enable n&k measurement.

Imports: measurement data in any text format, specifically supports import from all major ellipsometer/reflectomer instruments

Integrates: with many commercial fiberoptics spectrometers for smooth data acquisition and data analysis

TFCompanion brochure

WHY TFCompanion?

  • User friendly yet powerful software. Build  from ground up  based on decades of experience in optical methrology
  • Extended materials database (500+) and support for many parameterized material types (Cauchy,Tauc-Lorentz, etc.)
  • Support corrections for backside reflectance, focused beam, dullness, suirface roughness, wavelength/angle resolution and many more.
  •  Option for importing and analyzing reflectance, transmittance, ellipsometry data together
  • Automation: integrated TCPIP Modbus compliant server


  • USB dongle (license key). Can be transfered between the computers easily. Does not require driver installation
  • a memory stick with software distribution and documentation
  • One year technical support and software updates (after one year, annual subscrition is available)

TFCompanion Versions (see brochure for more details):
-R supports reflectance/ transmittance data analysis
-E supports ellipsometry data analysis
-RE supports ellipsometry and Reflectance transmittance data analysis
-REI supports ellipsometry, imaging ellipsometry, reflectance & transmittance data analysis
-RA advanced version reflectance/transmittance and hardware integration (supplied with MProbe)

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