MProbe Vis-Thin film measurement system is compact and versatile desktop system. It can measure translucent films in 10nm – 150µm thickness range on different substrates. And, yet, it is economical and easy to use. The production version of MProbe Vis(X) is designed to withstand vibrations and operate 24/7 using LAN connection. It can be used for inline and OEM applications. It is compatible with cleanroom environment.
MProbe20 VisX system is a version of the MProbe20 Vis system with improved sensitivity at longer wavelengths(> 700nm).
Ariel spectrometer was specially designed and optimized for use in MProbe. The salient features of spectrometer are astigmatism correction (torroid mirror) and the use of CMOS array detector.
These are just couple of examples. You can read more details in the following link: Ariel Spectrometer
5W TH light source is notable for several things:
SH200A sample stage makes thickness measurement easy. It has two important features:
TFCompanion is a full stack thin-film data analysis software that has simple and intuitive interface. It can be used by technician on production line and has all the sophisticated features for use in University or R&D lab. It encapsulates many decades of experience measuring and analyzing thin film applications. You can read more about TFCompanion