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MProbe20 UVViS is a desktop system for high precision measurement of thickness and refractive index of thin films. It is especially useful in measuring thickness and optical constants of materials with absorption edge in UV range. For example, metal oxide like TiO2, ZnO, etc. Measuring very thin films (< 50nm) is another application where UV range gives advantage. MProbe 20 UVVis capabilities overlap with that of MProbe 20 Vis system. But in these two applications UVVis system has an advantage over Vis system. MProbe 20 UVVis system is primarily used for R&D applications.
MProbe UVVis and MProbe UVVisX systems are using different versions of CMOS detectors. MProbe UVVisX(new system) has a more smooth spectrum with increased sensitivity in NIR range. UV fibers has reduced transmission in the NIR range, so increase detector sensitivity helps balance the spectrum. Although, UVVis systems are, primarily, used in the UV (shorter wavlength), improved sensitivity in NIR makes the system a little more versatile.
MProbe UVVis and UVVisX comparison in the UV range
MProbe UVVis and UVVisX (new) comparison the NIR range
Thin film measurement system. Practically, any transluscent film can be measured quickly and reliably.
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