Get a Quote

TFCOMPANION SOFTWARE

TFCompanion software is included with all MProbe systems. It is also available as a standalone software for thin-film data analysis (various versions for reflectance, ellipsometry, imaging ellipsometry, etc.) Software plays a critical role in thin-film thickness measurement. It has two distinct functions that are transparent to the user: control/data acquisition of reflectance data( from the hardware) and data analysis/interpretation.

TFCompanion is a powerful and user friendly software application for thin film analysis and metrology.It combines versatile analytical tools for interpretation of measurement data – to determine actual physical parameters of a filmstack (like thicknesses of the layers and optical properties of the materials).

Analyze: Reflectance, transmittance, ellipsometry spectra together or separately. Supports analysis of Imaging ellipsometry, reflectance, transmittance data. Determine filmstack parameters based on measurement results: thickness, optical constants, surface roughness, bandgap…

Simulate: reflectance/transmittance/ellipsometry spectra from a specified filmstack, determine measurement sensitivity to filmstack parameters

Estimate: measurement repeatability based on selected filmstack and system configuration. Pre-flight optimization of measurement recipe for maximum precision. Includes Large materials library(500+ materials), supports large number of parametrized material types from Cauchy to Tauc-Lorentz to Drude approximations to represent optical constants dispersion for a wide variety of materials and enable n&k measurement.

Imports: measurement data in any text format, specifically supports import from all major ellipsometer/reflectomer instruments

Integrates: with many commercial fiberoptics spectrometers for smooth data acquisition and data analysis

TFCompanion brochure

WHY TFCompanion?

  • User friendly yet powerful software. Build  from ground up  based on decades of experience in optical methrology
  • Extended materials database (500+) and support for many parameterized material types (Cauchy,Tauc-Lorentz, etc.)
  • Support corrections for backside reflectance, focused beam, dullness, suirface roughness, wavelength/angle resolution and many more.
  •  Option for importing and analyzing reflectance, transmittance, ellipsometry data together
  • Automation: integrated TCPIP Modbus compliant server

WHAT IS IN THE BOX

  • USB dongle (license key). Can be transfered between the computers easily. Does not require driver installation
  • a memory stick with software distribution and documentation
  • One year technical support and software updates (after one year, annual subscrition is available)

TFCompanion Versions (see brochure for more details):
-R supports reflectance/ transmittance data analysis
-E supports ellipsometry data analysis
-RE supports ellipsometry and Reflectance transmittance data analysis
-REI supports ellipsometry, imaging ellipsometry, reflectance & transmittance data analysis
-RA advanced version reflectance/transmittance and hardware integration (supplied with MProbe)

Privacy Settings
We use cookies to enhance your experience while using our website. If you are using our Services via a browser you can restrict, block or remove cookies through your web browser settings. We also use content and scripts from third parties that may use tracking technologies. You can selectively provide your consent below to allow such third party embeds. For complete information about the cookies we use, data we collect and how we process them, please check our Privacy Policy
Youtube
Consent to display content from Youtube
Vimeo
Consent to display content from Vimeo
Google Maps
Consent to display content from Google
Spotify
Consent to display content from Spotify
Sound Cloud
Consent to display content from Sound
Get a Quote
Cart Overview